Laser Diode/Bar Testing Systems

  • Update:Jun 13, 2017
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ST-LDC systems are fully configurable all-in-one laser diode and LED characterization devices for industries and RD laboratories. They are designed to measure and analyze all major characteristics of laser diodes and LEDs.

Product Introduction

ST-LDC systems are fully configurable, all-in-one laser diode and LED characterization devices for industries and R&D laboratories. They’re designed to measure and analyze all major characteristics of laser diodes and LEDs in a fast and reproducible way. They’re ideal tool for data sheet generation, quality control, failure analysis and research activities with semiconductor emitters.

ST-LDC systems are customizable tool to meet various needs required by different activities. They can measure devices from UV-LEDs to telecom laser diodes and high power laser bars, we can features a camera assisted pick’n'place robot capable of collecting diodes from customer supplied trays and finally marking and sorting them after the tests.

ST-LDC systems are having modular construction based on robust field bus technology. This construction makes high scalability and easy maintenance possible while keeping number of components minimum. On

ST-LDC system without pick’n'place robotics, devices under test (DUTs) are loaded into the system on multichannelload-traysthat are equipped with an inpidual low resistance bypass switch over each DUT to allow series connected devices operating even in case of open circuit or empty slots. Load tray also features channel specific temperature and voltage monitors and optionally a channel specific temperature control. ST-LDC capabilities

  Value Remarks
DUT type Laser diode, Laser bar, LED, HB LED, UHB LED Multiple DUT adapters are possible with single ST-LDC
DUT current driver

-> 0-500 mA (CW and/or pulsed)

-> 0-5 A (CW and/or pulsed)

-> 0-20A (CW and/or pulsed)

-> 0-60A (CW and/or pulsed)

-> 0-120A (CW and/or pulsed)

-> 0-200A (pulsed only)

-> 0-400A (pulsed only)

Multiple drivers are possible within single ST-LDC
Load-traysupport Yes  
Power measurement (LIV) 0-200 W optical, 300 – 3000 nm Various accuracy and calibration options available
Spectrum measurement 200 – 2400 nm, resolution from 10 pm to 1 nm Based on OSA or spectrometer
Far field measurement See ST-FFP specifications  
Visual ispection Near field integrity test Available as low and high power type
DUT operating condition control

-> TEC/peltier based, up to 30W cooling capacity per DUT, fast temperature variation possible

-> Water cooled, up to 400W cooling capacity per DUT

-> Nitrogen atmosphere optional

-> Humidity control optional

Microchannel DUT support only with water cooling
By-emitter measurements Spectrum, LIV, Polarity Only laser for diode bars
Throughput Depends on the ordered options, contact us to receive throughput calculations  
Dimensions 1200 x 900 x 1500 mm  
Weight 200 kg  
Power 220-240 V AC 5 A  
Approvals CE  
ST- LDCrobo additional capabilities
  Value Remarks
DUT type Laser diode, Laser bar, LED, HB LED, UHB LED Multiple DUT adapters are possible with single ST-LDC
Functions

-> Locate and measure chip position

-> Pick chip -> Align and place on testing bench

-> Optionally mark chip

-> Place chip: Back to the original tray, Sort to different trays, Discard

 
Machine vision alignment Included  
Throughput (standard model) Up to 3 DUT per minute Time varies by the tests to be performed, contact us for calculation
Throughput (high volume model) Up to 10 DUT per minute Tailor made system for specific testing needs, contact us for calculation
Bare chip handling Yes DUT’s supplied in a Gel-pak™
Mounted chip handling Yes Customer specific DUT trays
Available accuracy grades -> Basic: +/- 20 µm -> High: +/- 10 µm -> Extreme: +/- 1.25 µm  
Dimensions 1200 x 900 x 1500 mm  
Weight 200 kg  
Power 220-240 V AC 5 A  
Approvals CE  
Software:
  Value Remarks
Operating software Measuretool  
Result viewer & analysis tool Result browser  
Common Measurement Database (CMDB) Yes  
Operating system Windows 7 32 bit Supplied within LDC computer (included)
Optical Data analysis Ith, Slope Efficiency, Wall plug efficiency  
Electrical Rs, Vbias  
Thermal T0, T1  
Spectrum dλ/dT, SMSR, peak λ, FWHM  
Far field FWHM, Beam Steering  

Capabilities:

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